Photoelectron diffraction as a tool for the study of a...

Photoelectron diffraction as a tool for the study of a buried interface during heteroepitaxial growth of Sb/Ge/Si(111)

C. Westphal, S. Dreiner, F. Sökeland, H. Zacharias
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Volume:
396
Year:
1998
Language:
english
DOI:
10.1016/s0039-6028(97)00661-4
File:
PDF, 595 KB
english, 1998
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