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Field emission interferometry with the scanning tunneling microscope
A.J. Caamaño, Y. Pogorelov, O. Custance, J. Méndez, A.M. Baró, J.Y. Veuillen, J.M. Gómez-Rodrı́guez, J.J. SáenzVolume:
426
Year:
1999
Language:
english
DOI:
10.1016/s0039-6028(99)00346-5
File:
PDF, 323 KB
english, 1999