The interface structure in directly bonded silicon crystals studied by synchrotron X-ray diffraction
M Nielsen, R Feidenhans'l, P.B Howes, J Vedde, K Rasmussen, M Benamara, F GreyVolume:
442
Year:
1999
Language:
english
DOI:
10.1016/s0039-6028(99)00942-5
File:
PDF, 213 KB
english, 1999