Corrigendum to “Monitoring of mutagenic process with...

Corrigendum to “Monitoring of mutagenic process with piezoelectric quartz crystal impedance analysis”: [Talanta 53 (2000) 525–533]

Jinzhong Zhang, Wanzhi Wei, Anhong Zhou, Deliang He, Shouzhuo Yao, Qingji Xie
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Volume:
54
Year:
2001
Language:
english
DOI:
10.1016/s0039-9140(01)00345-9
File:
PDF, 34 KB
english, 2001
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