Application of FTIR phase-modulated ellipsometry to the...

Thin Solid Films 2001 Vol. 398-399; Iss. none

Application of FTIR phase-modulated ellipsometry to the characterisation of thin films on surface-enhanced IR absorption active substrates

E Garcia-Caurel, E Bertran, A Canillas
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Volume:
398-399
Year:
2001
Language:
english
DOI:
10.1016/s0040-6090(01)01309-8
File:
PDF, 375 KB
english, 2001
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