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Process analysis: properties of poly(ethylene terephthalate) measured by near infrared spectroscopy, 1. At-line analysis of poly(ethylene terephthalate) chips
Marinus P. B. Van Uum, Hans Lammers, Jaap P. De KleijnVolume:
196
Year:
1995
Language:
english
Pages:
6
DOI:
10.1002/macp.1995.021960621
File:
PDF, 299 KB
english, 1995