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X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of UV-exposed polystyrene
Richard M. France, Liam O'Toole, Robert D. Short, Nino PollicinoVolume:
196
Year:
1995
Language:
english
Pages:
11
DOI:
10.1002/macp.1995.021961122
File:
PDF, 609 KB
english, 1995