Time of flight secondary ion mass spectrometry (ToFSIMS) of...

Organic Geochemistry 2001 Vol. 32; Iss. 7

Time of flight secondary ion mass spectrometry (ToFSIMS) of a number of hopanoids

A. Steele, J.K.W. Toporski, R. Avci, S. Guidry, D.S. McKay
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Volume:
32
Year:
2001
Language:
english
DOI:
10.1016/s0146-6380(01)00048-1
File:
PDF, 572 KB
english, 2001
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