Short-term memory tests in personnel selection: Low adverse...

Intelligence 1996 Vol. 23; Iss. 1

Short-term memory tests in personnel selection: Low adverse impact and high validity

Jennifer M. Verive, Michael A. McDaniel
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Volume:
23
Year:
1996
Language:
english
DOI:
10.1016/s0160-2896(96)80003-1
File:
PDF, 993 KB
english, 1996
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