Enhancement of Ag electromigration resistance by a novel encapsulation process
Yuxiao Zeng, Linghui Chen, Y.L Zou, P.A Nyugen, J.D Hansen, T.L AlfordVolume:
45
Year:
2000
Language:
english
DOI:
10.1016/s0167-577x(00)00097-5
File:
PDF, 556 KB
english, 2000