X-ray photoelectron spectroscopic measurements on glassy...

X-ray photoelectron spectroscopic measurements on glassy Ge20S80−xBix (x=0,16)

G Saffarini, J.M Saiter
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Volume:
46
Year:
2000
Language:
english
DOI:
10.1016/s0167-577x(00)00196-8
File:
PDF, 131 KB
english, 2000
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