Secondary ion mass spectrometry (SIMS) microscopy: A new...

Microscopy Research and Technique 1997 / 02 Vol. 36; Iss. 4

Secondary ion mass spectrometry (SIMS) microscopy: A new tool for pharmacological studies in humans

Fragu, Philippe, Kahn, Edmond
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Volume:
36
Language:
english
Pages:
5
Journal:
Microscopy Research and Technique
DOI:
10.1002/(sici)1097-0029(19970215)36:43.0.co;2-k
Date:
February, 1997
File:
PDF, 159 KB
english, 1997
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