Two-Photon Pattern Bleaching for Characterizing Structural...

Two-Photon Pattern Bleaching for Characterizing Structural Changes in Polymer Films

Edward Van Keuren, Wolfgang Schrof
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Volume:
23
Year:
2002
Language:
english
Pages:
3
DOI:
10.1002/marc.200290008
File:
PDF, 127 KB
english, 2002
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