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Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysis
Wim Bijnens, Jean Manca, Ting-Di Wu, Marc D'Olicslacger, Dirk Vanderzande, Jan Gelan, Ward De Ceuninck, Luc De Schepper, Lambert M. StalsVolume:
83
Year:
1996
Language:
english
DOI:
10.1016/s0379-6779(97)80083-5
File:
PDF, 517 KB
english, 1996