X-Ray diffraction study and electrical and thermal...

X-Ray diffraction study and electrical and thermal transport properties of the nGeTe·mBi2Te3 homologous series compounds

L.E Shelimova, P.P Konstantinov, O.G Karpinsky, E.S Avilov, M.A Kretova, V.S Zemskov
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Volume:
329
Year:
2001
Language:
english
DOI:
10.1016/s0925-8388(01)01685-1
File:
PDF, 451 KB
english, 2001
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