XES, XPS and NEXAFS studies of the electronic structure of...

XES, XPS and NEXAFS studies of the electronic structure of cubic MoO1.9 and H1.63MoO3 thick films

O.Yu Khyzhun, T Strunskus, Yu.M Solonin
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Volume:
366
Year:
2004
Language:
english
DOI:
10.1016/s0925-8388(03)00736-9
File:
PDF, 152 KB
english, 2004
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