Transmission electron microscopy investigations of defects...

Journal of Alloys and Compounds 1997 Vol. 251; Iss. 1-2

Transmission electron microscopy investigations of defects in molecular beam epitaxy-grown oxide films

E.J. Williams, A. Daridon, F. Arrouy, J. Perret, Y. Jaccard, J.-P. Locquet, E. Mächler, H. Siegenthaler, P. Martinoli, Ø. Fischer
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Volume:
251
Year:
1997
Language:
english
DOI:
10.1016/s0925-8388(96)02760-0
File:
PDF, 1.57 MB
english, 1997
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