The relation between the defect structure, the surface roughness and the growth conditions of YBa2Cu3O7−δ films
B. Dam, C. Træholt, B. Stäuble-Pümpin, J. Rector, D.G. de GrootVolume:
251
Year:
1997
Language:
english
DOI:
10.1016/s0925-8388(96)02764-8
File:
PDF, 997 KB
english, 1997