Moessbauer reflectometry of ultrathin multilayer Zr(10 nm)/[57Fe(1.6 nm)/Cr(1.7 nm)×26]/Cr(50 nm) film using synchrotron radiation
M.A. Andreeva, S.M. Irkaev, V.G. Semenov, K.A. Prokhorov, N.N. Salashchenko, A.I. Chumakov, R. RüfferVolume:
286
Year:
1999
Language:
english
DOI:
10.1016/s0925-8388(98)01029-9
File:
PDF, 695 KB
english, 1999