Diagnostic electron microscopy, volume 3. Edited by Benjamin F. Trump and Raymond T. Jones 536 pp, John Wiley & Sons, New York, NY, 1980. $57.50
Don J. LapenasVolume:
2
Year:
1980
Language:
english
Pages:
2
DOI:
10.1002/micr.1920020119
File:
PDF, 160 KB
english, 1980