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Defect analysis in FeAl and FeSi with positron lifetime spectroscopy and Doppler broadening
A. Broska, J. Wolff, M. Franz, Th. HehenkampVolume:
7
Year:
1999
Language:
english
DOI:
10.1016/s0966-9795(98)00098-3
File:
PDF, 258 KB
english, 1999