Applications of the FIB lift-out technique for TEM specimen...

Microscopy Research and Technique 1998 / 05 Vol. 41; Iss. 4

Applications of the FIB lift-out technique for TEM specimen preparation

Giannuzzi, Lucille A., Drown, Jennifer L., Brown, Steve R., Irwin, Richard B., Stevie, Frederick A.
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Volume:
41
Language:
english
Pages:
6
Journal:
Microscopy Research and Technique
DOI:
10.1002/(sici)1097-0029(19980515)41:43.0.co;2-q
Date:
May, 1998
File:
PDF, 449 KB
english, 1998
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