High-resolution electron microscopy and electron...

High-resolution electron microscopy and electron tomography: resolution versus precision

S. Van Aert, A.J. den Dekker, D. Van Dyck, A. van den Bos

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Volume:

138

Year:

2002

Language:

english

DOI:

10.1016/s1047-8477(02)00016-3

File:

PDF, 218 KB

english, 2002

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