A time- and frequency-domain characterization of a...

International Journal of RF and Microwave Computer-Aided Engineering 2004 Vol. 14; Iss. 6

A time- and frequency-domain characterization of a thin-film metamorphic HEMT under modulated backside illumination

R. Vandersmissen, D. Schreurs, S. Vandenberghe, G. Borghs
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Volume:
14
Year:
2004
Language:
english
Pages:
8
DOI:
10.1002/mmce.20042
File:
PDF, 228 KB
english, 2004
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