Introduction to in situ electron microscopy in the materials sciences
Yeadon, MarkVolume:
42
Language:
english
Pages:
2
Journal:
Microscopy Research and Technique
DOI:
10.1002/(sici)1097-0029(19980915)42:43.0.co;2-l
Date:
September, 1998
File:
PDF, 21 KB
english, 1998