S-Parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties
J. Hinojosa, L. Faucon, P. Queffelec, F. HuretVolume:
30
Year:
2001
Language:
english
Pages:
5
DOI:
10.1002/mop.1222
File:
PDF, 203 KB
english, 2001