Analysis and experiment for drain bias dependence of IMD...

Microwave and Optical Technology Letters 2008 Vol. 50; Iss. 11

Analysis and experiment for drain bias dependence of IMD sweet spots in GaN HEMT power amplifier

Yong-Sub Lee, Mun-Woo Lee, Yoon-Ha Jeong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/mop.23863
File:
PDF, 336 KB
english, 2008
Conversion to is in progress
Conversion to is failed