Compact 3-D on-wafer radiation pattern measurement system...

Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas

Sylvain Ranvier, Mikko Kyrö, Clemens Icheln, Cyril Luxey, Robert Staraj, Pertti Vainikainen
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Volume:
51
Year:
2009
Language:
english
Pages:
6
DOI:
10.1002/mop.24034
File:
PDF, 443 KB
english, 2009
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