Measurement of carrier escape rates, exciton saturation intensity, and saturation density in electrically biased multiple-quantum-well modulators
Sizer, T., II, Woodward, T.K., Keller, U., Sauer, K., Chiu, T.-H., Sivco, D.L., Cho, A.Y.Volume:
30
Year:
1994
Language:
english
DOI:
10.1109/3.283787
File:
PDF, 763 KB
english, 1994