Electron transport across bulk (Al/sub x/Ga/sub 1-x/)/sub...

IEEE Journal of Quantum Electronics 2000 Vol. 36; Iss. 11

Electron transport across bulk (Al/sub x/Ga/sub 1-x/)/sub 0.5/In/sub 0.5/P barriers determined from the I-V characteristics of n-i-n diodes measured between 60 and 310 K

Morrison, A.P., Lambkin, J.D., van der Poel, C.J., Valster, A.
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Volume:
36
Year:
2000
Language:
english
DOI:
10.1109/3.890277
File:
PDF, 166 KB
english, 2000
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