1.3 µm buried heterojunction laser diodes under high electrical stress: Leakage currents and aging behavior
Kuindersma, P., Valster, A., Baks, W.Volume:
21
Year:
1985
Language:
english
DOI:
10.1109/jqe.1985.1072702
File:
PDF, 2.91 MB
english, 1985