Performance and Reliability of 12.5-Gb/s Oxide-Free 850-nm Mesa VCSELs
Murty, M.V.R., Chirovsky, L.M.F., Syn-Yem Hu, Venables, D., Cheng, M., Ciesla, C.M.Volume:
44
Year:
2008
Language:
english
DOI:
10.1109/jqe.2007.911677
File:
PDF, 828 KB
english, 2008