![](/img/cover-not-exists.png)
Simulation and measurement of supply and substrate noise in mixed-signal ICs
Owens, B.E., Adluri, S., Birrer, P., Shreeve, R., Arunachalam, S.K., Mayaram, K., Fiez, T.S.Volume:
40
Year:
2005
Language:
english
DOI:
10.1109/jssc.2004.841039
File:
PDF, 1011 KB
english, 2005