The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs
Ming-Dou Ker, Kun-Hsien LinVolume:
40
Year:
2005
Language:
english
DOI:
10.1109/jssc.2005.852046
File:
PDF, 1.13 MB
english, 2005