In-Situ Measurement of Supply-Noise Maps With Millivolt...

IEEE Journal of Solid-State Circuits 2007 Vol. 42; Iss. 4

In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution

Kanno, Y., Kondoh, Y., Irita, T., Hirose, K., Mori, R., Yasu, Y., Komatsu, S., Mizuno, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
42
Year:
2007
Language:
english
DOI:
10.1109/jssc.2007.891662
File:
PDF, 2.00 MB
english, 2007
Conversion to is in progress
Conversion to is failed