An SRAM Design in 65-nm Technology Node Featuring Read and...

IEEE Journal of Solid-State Circuits 2007 Vol. 42; Iss. 4

An SRAM Design in 65-nm Technology Node Featuring Read and Write-Assist Circuits to Expand Operating Voltage

Pilo, H., Barwin, C., Braceras, G., Browning, C., Lamphier, S., Towler, F.
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Volume:
42
Year:
2007
Language:
english
DOI:
10.1109/jssc.2007.892153
File:
PDF, 1.30 MB
english, 2007
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