A 64 64-Pixel CMOS Test Chip for the Development of...

IEEE Journal of Solid-State Circuits 2008 Vol. 43; Iss. 9

A 64 64-Pixel CMOS Test Chip for the Development of Large-Format Ultra-High-Speed Snapshot Imagers

Berger, R., Rathman, D.D., Tyrrell, B.M., Kohler, E.J., Rose, M.K., Murphy, R.A., Perry, T.S., Robey, H.F., Weber, F.A., Craig, D.M., Soares, A.M., Vernon, S.P., Reich, R.K.
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Volume:
43
Year:
2008
Language:
english
DOI:
10.1109/jssc.2008.2001912
File:
PDF, 3.55 MB
english, 2008
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