Large-Scale SRAM Variability Characterization in 45 nm CMOS

IEEE Journal of Solid-State Circuits 2009 Vol. 44; Iss. 11

Large-Scale SRAM Variability Characterization in 45 nm CMOS

Zheng Guo, Carlson, A., Liang-Teck Pang, Duong, K.T., Tsu-Jae King Liu, Nikolic, B.
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Volume:
44
Year:
2009
Language:
english
DOI:
10.1109/jssc.2009.2032698
File:
PDF, 5.12 MB
english, 2009
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