An All-In-One Silicon Odometer for Separately Monitoring...

IEEE Journal of Solid-State Circuits 2010 Vol. 45; Iss. 4

An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB

Keane, J., Xiaofei Wang, Persaud, D., Kim, C.H.
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Volume:
45
Year:
2010
Language:
english
DOI:
10.1109/jssc.2010.2040125
File:
PDF, 3.56 MB
english, 2010
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