Noise-Immune Embedded NAND-ROM Using a Dynamic Split...

IEEE Journal of Solid-State Circuits 2010 Vol. 45; Iss. 10

Noise-Immune Embedded NAND-ROM Using a Dynamic Split Source-Line Scheme for VDDmin and Speed Improvements

Meng-Fan Chang, Shu-Meng Yang, Chih-Wei Liang, Chih-Chyuang Chiang, Pi-Feng Chiu, Ku-Feng Lin
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Volume:
45
Year:
2010
Language:
english
DOI:
10.1109/jssc.2010.2060279
File:
PDF, 2.69 MB
english, 2010
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