Improvement of Read Margin and Its Distribution by...

Improvement of Read Margin and Its Distribution by Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection

Miyaji, K., Tanakamaru, S., Honda, K., Miyano, S., Takeuchi, K.
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Volume:
46
Year:
2011
Language:
english
DOI:
10.1109/jssc.2011.2147030
File:
PDF, 2.37 MB
english, 2011
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