"Hump" current dependence upon trapping effects...

"Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes

Holonyak, N., Jr., Selig, T., Smith, J.
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Volume:
8
Year:
1961
Language:
english
DOI:
10.1109/t-ed.1961.14846
File:
PDF, 328 KB
english, 1961
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