![](/img/cover-not-exists.png)
"Hump" current dependence upon trapping effects and the relationship to some aspects of the forward-injection failure of GaAs tunnel diodes
Holonyak, N., Jr., Selig, T., Smith, J.Volume:
8
Year:
1961
Language:
english
DOI:
10.1109/t-ed.1961.14846
File:
PDF, 328 KB
english, 1961