A scalable scan-path test point insertion technique to...

A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs

Seongmoon Wang, Chakradhar, S.T.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
25
Year:
2006
Language:
english
DOI:
10.1109/tcad.2005.855929
File:
PDF, 291 KB
english, 2006
Conversion to is in progress
Conversion to is failed