Relationship Between Entropy and Test Data Compression

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2007 Vol. 26; Iss. 2

Relationship Between Entropy and Test Data Compression

Balakrishnan, K. J., Touba, N. A.
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Volume:
26
Year:
2007
Language:
english
DOI:
10.1109/tcad.2006.882600
File:
PDF, 286 KB
english, 2007
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