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Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits
Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.Volume:
26
Year:
2007
Language:
english
DOI:
10.1109/tcad.2006.884870
File:
PDF, 706 KB
english, 2007