Test Wrapper Design and Optimization Under Power...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2007 Vol. 26; Iss. 8

Test Wrapper Design and Optimization Under Power Constraints for Embedded Cores With Multiple Clock Domains

Qiang Xu, Nicolici, N., Chakrabarty, K.
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Volume:
26
Year:
2007
Language:
english
DOI:
10.1109/tcad.2007.893556
File:
PDF, 495 KB
english, 2007
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