Low-Power Scan Operation in Test Compression Environment
Czysz, D., Kassab, M., Xijiang Lin, Mrugalski, G., Rajski, J., Tyszer, J.Volume:
28
Year:
2009
Language:
english
DOI:
10.1109/tcad.2009.2030445
File:
PDF, 1.13 MB
english, 2009