A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test
Wen-Wen Hsieh, Shih-Liang Chen, I-Sheng Lin, TingTing HwangVolume:
29
Year:
2010
Language:
english
DOI:
10.1109/tcad.2009.2035584
File:
PDF, 639 KB
english, 2010