Statistical Path Selection for At-Speed Test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2010 Vol. 29; Iss. 5

Statistical Path Selection for At-Speed Test

Zolotov, V., Jinjun Xiong, Fatemi, H., Visweswariah, C.
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Volume:
29
Year:
2010
Language:
english
DOI:
10.1109/tcad.2010.2043570
File:
PDF, 623 KB
english, 2010
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