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Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression
Chao-Wen Tzeng, Shi-Yu HuangVolume:
29
Year:
2010
Language:
english
DOI:
10.1109/tcad.2010.2043758
File:
PDF, 394 KB
english, 2010